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Study on field-emission characteristics of electrodeposited Co-doped ZnO thin films

机译:电沉积Co掺杂ZnO薄膜的场发射特性研究

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Co-doped ZnO films were fabricated using electrodeposition method on the ITO substrates. The structure of the Co-doped ZnO films was analyzed by X-ray diffraction and scanning electron microscope. The field-emission characteristics of the prepared Co-doped ZnO films were examined using diode structure in a vacuum chamber. The examined results indicate that the Co-doping cause the turn-on field increasing by increasing the concentration of the Co-dopant, probably due to the band gap changing, which could attributed to the spd exchange interactions between the band electrons and the localized d electrons of the Co~2 ions substituting Zn ions in the films.
机译:使用电沉积方法在ITO基板上制备了共掺杂的ZnO薄膜。通过X射线衍射和扫描电子显微镜分析了Co掺杂ZnO薄膜的结构。使用二极管结构在真空室中检查了制备的Co掺杂ZnO薄膜的场发射特性。检验结果表明,Co掺杂可通过增加Co掺杂剂的浓度来增加导通场,这可能是由于带隙的变化所致,这可能归因于带电子与局部d之间的spd交换相互作用。薄膜中Co〜2离子取代Zn离子的电子

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