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Density functional theory study on boron- and phosphorus-doped hydrogen-passivated silicene

机译:硼和磷掺杂的氢钝化硅的密度泛函理论研究

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摘要

When silicene is passivated by hydrogen, a bandgap occurs so that it becomes a semiconductor. Analogous to all the other semiconductors, doping is highly desired to realize the potential of hydrogen-passivated silicene (H-silicene). In the framework of density functional theory (DFT), we have studied the doping of H-silicene with boron (B) and phosphorus (P). The concentration of B or P ranges from 1.4% to 12.5%. It is found that the doping of B or P enables the indirect-bandgap H-silicene to be a semiconductor with a direct bandgap. With the increase of the concentration of B or P, both the valence band and the conduction band shift to lower energies, while the bandgap decreases. Both B-and P-doping lead to the decrease of the effective mass of holes and electrons in H-silicene. For both B-and P-doped H-silicene a subband absorption peak may appear, which blueshifts with the increase of the dopant concentration.
机译:当硅被氢钝化时,会出现带隙,从而成为半导体。与所有其他半导体类似,为了实现氢钝化硅(H-silicene)的潜力,非常需要掺杂。在密度泛函理论(DFT)的框架内,我们研究了硼(B)和磷(P)对H-硅的掺杂。 B或P的浓度为1.4%至12.5%。发现B或P的掺杂使得间接带隙H-硅成为具有直接带隙的半导体。随着B或P浓度的增加,价带和导带都移动到较低的能量,而带隙减小。 B掺杂和P掺杂都会导致H型硅中空穴和电子的有效质量下降。对于B掺杂和P掺杂的H型硅,都会出现一个子带吸收峰,该峰随掺杂剂浓度的增加而蓝移。

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