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Highly ordered vertical GaAs nanowire arrays with dry etching and their optical properties

机译:具有干法刻蚀的高度有序的垂直GaAs纳米线阵列及其光学特性

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We report fabrication methods, including metal masks and dry etching, and demonstrate highly ordered vertical gallium arsenide nanowire arrays. The etching process created high aspect ratio, vertical nanowires with insignificant undercutting from the mask, allowing us to vary the diameter from 30 nm to 400 nm with a pitch from 250 nm to 1100 nm and length up to 2.2 μm. A diameter to pitch ratio of ~68% was achieved. We also measured the reflectance from the nanowire arrays and show experimentally diameter-dependent strong absorption peaks resulting from resonant optical mode excitations within these nanowires. The reflectance curves match very well with simulations. The work done here paves the way towards achieving high efficiency solar cells and tunable photodetectors using III-V nanowires.
机译:我们报告了制造方法,包括金属掩模和干法蚀刻,并展示了高度有序的垂直砷化镓纳米线阵列。蚀刻工艺产生了高深宽比的垂直纳米线,且掩模上的底切没有明显的底切,从而使我们能够将直径从30 nm改变为400 nm,间距从250 nm改变为1100 nm,长度达到2.2μm。直径与节距的比率达到〜68%。我们还测量了纳米线阵列的反射率,并显示了由这些纳米线内的共振光学模式激发所产生的直径相关的强吸收峰的实验值。反射率曲线与模拟非常吻合。此处完成的工作为使用III-V纳米线实现高效太阳能电池和可调光探测器铺平了道路。

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