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Hydrothermal growth of highly textured BaTiO_3 films composed of nanowires

机译:纳米线组成的高织构BaTiO_3薄膜的水热生长

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摘要

Textured barium titanate (BaTiO_3) films are attracting immense research interest due to their lead-free composition and excellent piezoelectric and dielectric properties. Most synthesis methods for these films require a high temperature, leading to the formation of a secondary phase and an overall decrease in the electrical properties of the ceramic. In order to alleviate these issues, a novel fabrication method is introduced by transferring oriented rutile TiO_2 nanowires to a textured BaTiO_3 film at temperatures below 160 °C. The microstructure and thickness of the fabricated BaTiO_3 films were characterized by scanning electron microscopy, and the crystal structure and degree of orientation were evaluated by x-ray diffraction patterns using the Lotgering method. It is shown that the thickness of the BaTiO_3 film can be controlled by the length of TiO_2 nanowire array template, and the degree of orientation of the textured BaTiO_3 films is highly dependent on the film thickness; the crystallographic orientation has been measured to reach up to 87%. The relative dielectric constant (ε_r = 1300) and ferroelectric properties (P_r = 2.7 μC cm~(-2), E_c = 4.0 kV mm ~(-1)) of the textured BaTiO_3 films were also characterized to demonstrate their potential application in sensors, random access memory, and micro-electromechanical systems.
机译:织构化钛酸钡(BaTiO_3)膜由于其无铅成分以及出色的压电和介电性能而吸引了巨大的研究兴趣。这些薄膜的大多数合成方法都需要高温,从而导致形成第二相并整体降低陶瓷的电性能。为了减轻这些问题,通过将取向金红石TiO_2纳米线在低于160℃的温度下转移到织构的BaTiO_3膜上,引入了一种新颖的制造方法。通过扫描电子显微镜对所制备的BaTiO_3薄膜的微观结构和厚度进行表征,并使用Lotgering方法通过X射线衍射图评估晶体结构和取向度。结果表明,BaTiO_3薄膜的厚度可以通过TiO_2纳米线阵列模板的长度来控制,织构的BaTiO_3薄膜的取向度高度依赖于薄膜的厚度。晶体取向已测得高达87%。表征了结构化的BaTiO_3薄膜的相对介电常数(ε_r= 1300)和铁电性能(P_r = 2.7μCcm〜(-2),E_c = 4.0 kV mm〜(-1)),以证明其在传感器中的潜在应用,随机存取存储器和微机电系统。

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