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首页> 外文期刊>Nanotechnology >Contact printing of horizontally-aligned p-type Zn_3P_2 nanowire arrays for rigid and flexible photodetectors
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Contact printing of horizontally-aligned p-type Zn_3P_2 nanowire arrays for rigid and flexible photodetectors

机译:用于刚性和柔性光电探测器的水平排列的p型Zn_3P_2纳米线阵列的接触印刷

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摘要

Zn_3P_2 is an important p-type semiconductor with the ability to detect almost all visible and ultraviolet light. By using the simple and efficient contact printing process, we reported the assembly of horizontally-aligned p-type Zn_3P_2 nanowire arrays to be used as building blocks for high performance photodetectors. Horizontally-aligned Zn_3P_2 nanowire arrays were first printed on silicon substrate to make thin-film transistors, exhibiting typical p-type transistor behavior with a high on/off ratio of 10~3. Besides, the Zn_3P_2 nanowire array based devices showed a substantial response to illuminated lights with a wide range of wavelengths and densities. Flexible photodetectors were also fabricated by contact printing of horizontally-aligned Zn_3P_2 nanowire arrays on flexible PET substrate, showing a comparable performance to the device on rigid silicon substrate.
机译:Zn_3P_2是一种重要的p型半导体,具有检测几乎所有可见光和紫外线的能力。通过使用简单有效的接触印刷工艺,我们报道了水平排列的p型Zn_3P_2纳米线阵列的组装,这些阵列将用作高性能光电探测器的构建基块。首先将水平排列的Zn_3P_2纳米线阵列印刷在硅基板上制成薄膜晶体管,该晶体管表现出典型的p型晶体管特性,其开/关比高至10〜3。此外,基于Zn_3P_2纳米线阵列的器件对各种波长和密度的照明光都表现出了显着的响应。还通过在柔性PET基板上接触印刷水平排列的Zn_3P_2纳米线阵列来制造柔性光电探测器,显示出与刚性硅基板上的器件相当的性能。

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