首页> 外国专利> Nanowire-based vertical memory cell array having a back plate and nanowire seeds contacting a bit line

Nanowire-based vertical memory cell array having a back plate and nanowire seeds contacting a bit line

机译:具有背板和接触位线的纳米线种子的基于纳米线的垂直存储单元阵列

摘要

The present disclosure relates to semiconductor structures and, more particularly, to vertical memory cell structures and methods of manufacture. The vertical memory cell includes a vertical nanowire capacitor and vertical pass gate transistor. The vertical nanowire capacitor composes of: a plurality of vertical nanowires extending from an insulator layer; a dielectric material on vertical sidewalls of the plurality of vertical nanowires; doped material provided between the plurality of vertical nanowire; the pass gate transistor composes of: high-k dielectric on top part of the nanowire, metal layer surrounding high-k material as all-around gate. And there is dielectric layer in between vertical nanowire capacitor and vertical nanowire transistor as insulator. At least one bitline extending on a top of the plurality of vertical nanowires and in electrical contact therewith; and at least one wordline formed on vertical sidewalls of the plurality of vertical nanowires and separated therefrom by the dielectric material.
机译:本公开涉及半导体结构,并且更具体地,涉及垂直存储单元结构和制造方法。垂直存储单元包括垂直纳米线电容器和垂直通过栅晶体管。垂直纳米线电容器包括:从绝缘体层延伸的多个垂直纳米线;以及从绝缘体层延伸的多个垂直纳米线。多个垂直纳米线的垂直侧壁上的介电材料;掺杂材料设置在多个垂直纳米线之间;传输栅晶体管由以下组成:纳米线顶部的高k电介质,围绕高k材料的金属层作为全能栅。在垂直纳米线电容器和垂直纳米线晶体管之间有绝缘层作为绝缘体。至少一条位线在所述多个垂直纳米线的顶部上延伸并与其电接触;至少一条字线形成在多条垂直纳米线的垂直侧壁上,并通过介电材料与其分离。

著录项

  • 公开/公告号US9966431B2

    专利类型

  • 公开/公告日2018-05-08

    原文格式PDF

  • 申请/专利权人 GLOBALFOUNDRIES INC.;

    申请/专利号US201615078112

  • 发明设计人 WAIKIN LI;CHENGWEN PEI;PING-CHUAN WANG;

    申请日2016-03-23

  • 分类号H01L29/06;H01L27/108;H01L29/423;H01L23/522;

  • 国家 US

  • 入库时间 2022-08-21 12:55:10

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