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Nonvolatile multibit Schottky memory based on single n-type Ga doped CdSe nanowires

机译:基于单n型Ga掺杂CdSe纳米线的非易失性多位肖特基存储器

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摘要

Nonvolatile resistive switching has been observed for the first time in CdSe nanowire (NW)/Au Schottky barrier diodes, where a Schottky contact electrode and an Ohmic contact electrode were formed at the Au/CdSe NW and CdSe NW/In interfaces, respectively. The CdSe NWs Schottky devices were found to possess multibit storage ability in an individual nanowire, and exhibited excellent memory characteristics, with a resistance on/off ratio exceeding four orders of magnitude, a long retention time of over 10 ~4 s and a lower operating voltage of 2V. By replacing the SiO _2/Si substrate with a poly ethylene terephthalate substrate, flexible and transparent memory devices with superior stability under strain were realized. The resistive switching of CdSe NW/Au Schottky devices is understood by electron trapping and detrapping in the interfacial oxide layer. Our findings provide a viable way to create new functional high-density nonvolatile multibit memory devices compatible with simple processing techniques for normal one-dimensional nanomaterials.
机译:在CdSe纳米线(NW)/ Au肖特基势垒二极管中首次观察到非易失性电阻开关,其中在Au / CdSe NW和CdSe NW / In界面分别形成了肖特基接触电极和欧姆接触电极。发现CdSe NWs肖特基器件在单个纳米线中具有多位存储能力,并表现出出色的存储特性,电阻开/关比超过四个数量级,保留时间超过10〜4 s,运行时间更低电压为2V。通过用聚对苯二甲酸乙二醇酯衬底代替SiO _2 / Si衬底,实现了在应变下具有优异稳定性的柔性和透明存储器件。 CdSe NW / Au Schottky器件的电阻性开关可通过界面氧化物层中的电子俘获和去俘获来理解。我们的发现提供了一种可行的方式来创建与常规一维纳米材料的简单处理技术兼容的新型功能性高密度非易失性多位存储设备。

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