In situ Thickness Determination of Adsorbed Layers of Poly(2-Vinylpyridine)-Polystyrene Diblock Copolymers by Ellipsometry

摘要

To gain more insight into the process of formation of adsorbed layers of diblock copolymers,ellipsometry was used to monitor in situ the thickness and adsrobedamount of a series o fpolystyrene-b-poly(2-vinylpyridine)diblock copolymers adsorbed process.Second,it is found that in the early stages of layer formation,at the point whereadsrobed chains are forced to laterally overlap,the thickness of the PS/PVP layers is equal to approximatedly 2.2 R_g.As the adsorbed amount surpasses approximately twicethis surface density,the thickness growsasthe layer becomes progressively more crowded.In this growth regime,the dependence of the thickness on the adsorbed amount makes a transition to a one-third power-law at the highest adsorbed amounts.