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Thickness-dependent photoresponse characteristics of miscut LaSrAlO_(4) single crystals for ultraviolet detection

机译:错切LaSrAlO_(4)单晶用于紫外检测的厚度依赖性光响应特性

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We systematically study ultraviolet laser-induced ultrafast photovoltaic effect in miscut LaSrAlO_(4) single crystal wafers with different thicknesses at ambient temperature without any applied bias. An open-circuit photovoltage (PV) is obtained when the wafer is irradiated by a 248 nm laser pulse of 20 ns duration. With the decrease of crystal thickness, the peak PV increased to a maximum of 2.66 mV at 340 (mu)m and then decreased to 1.3 mV at 155 (mu)m. Meanwhile, the 10percent-90percent rise time of photovoltaic responses declines gradually. The inner mechanism of the present thickness-dependent photovoltaic response is discussed.
机译:我们系统地研究了在环境温度下在不施加任何偏压的情况下,错切的LaSrAlO_(4)单晶晶片的紫外激光诱导的超快光伏效应。当用持续时间为20 ns的248 nm激光脉冲照射晶圆时,会获得开路光电压(PV)。随着晶体厚度的减小,峰值PV在340μm处增加至最大值2.66mV,然后在155μm处减小至1.3mV。同时,光伏响应的上升时间从10%到90%逐渐下降。讨论了当前厚度依赖性光伏响应的内部机理。

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