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Quantitative Evaluation of the Carbon Hybridization State by Near Edge X-ray Absorption Fine Structure Spectroscopy

机译:近缘X射线吸收精细结构光谱定量评价碳杂化态

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The characterization of the local bonding configuration of carbon in carbon-based materials is of paramount importance since the properties of such materials strongly depend on the distribution of carbon hybridization states, the local ordering, and the degree of hydrogenation. Carbon is near edge X-ray absorption fine structure (NEXAFS) spectroscopy is one of the most powerful techniques for gaining insights into the bonding configuration of near-surface carbon atoms. The common methodology for quantitatively evaluating the carbon hybridization state using C is NEXAFS measurements, which is based on the analysis of the sample of interest and of a highly ordered pyrolytic graphite (HOPG) reference sample, was reviewed and critically assessed, noting that inconsistencies are found in the literature in applying this method. A theoretical rationale for the specific experimental conditions to be used for the acquisition of HOPG reference spectra is presented together with the potential sources of uncertainty and errors in the correctly computed fraction of sp(2)-bonded carbon. This provides a specific method for analyzing the distribution of carbon hybridization state using NEXAFS spectroscopy. As an illustrative example, a hydrogenated amorphous carbon film was analyzed using this method and showed good agreement with X-ray photoelectron spectroscopy (which is surface sensitive). Furthermore, the results were consistent with analysis from Raman spectroscopy (which is not surface sensitive), indicating the absence of a structurally different near-surface region in this particular thin film material. The present work can assist surface scientists in the analysis of NEXAFS spectra for the accurate characterization of the structure of carbon-based materials.
机译:碳基材料中碳的局部键合构型的表征至关重要,因为此类材料的性能很大程度上取决于碳杂化状态的分布,局部有序性和氢化程度。碳是近边缘X射线吸收精细结构(NEXAFS)光谱学,是对洞悉近表面碳原子的键合结构的最有力技术之一。使用C定量评估碳杂化状态的常用方法是NEXAFS测量,该方法基于对目标样品和高阶热解石墨(HOPG)参考样品的分析,并进行了严格评估,并指出存在不一致之处。在文献中发现使用这种方法。提出了用于获取HOPG参考光谱的特定实验条件的理论原理,以及正确计算出的sp(2)键合碳的分数中的不确定性和误差的潜在来源。这提供了使用NEXAFS光谱分析碳杂化状态分布的特定方法。作为说明性实例,使用该方法分析了氢化非晶碳膜,并显示出与X射线光电子能谱(表面敏感)的一致性。此外,结果与拉曼光谱分析(对表面不敏感)一致,表明在这种特殊的薄膜材料中没有结构上不同的近表面区域。目前的工作可以协助表面科学家分析NEXAFS光谱,以准确表征碳基材料的结构。

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