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DC Magnetron Sputtered Polyaniline-HCI Thin Films for Chemical Sensing Applications

机译:用于化学传感应用的直流磁控溅射聚苯胺-HCl薄膜

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Thin films of conducting polymers exhibit unique chemical and physical properties that render them integral parts in microelectronics, energy storage devices, and chemical sensors. Overall, polyaniline (PAni) doped in acidic media has shown metal-like electronic conductivity, though exact physical and chemical properties are dependent on the polymer structure and dopant type. Difficulties arising from poor processability render production of doped PAni thin films particularly challenging. In this contribution, DC magnetron sputtering, a physical vapor deposition technique, is applied to the preparation of conductive thin films of PAni doped with hydrochloric acid (PAni-HCl) in an effort to circumvent issues associated with conventional thin film preparation methods. Samples manufactured by the sputtering method are analyzed along with samples prepared by conventional drop-casting. Physical characterization (atomic force microscopy, AFM) confirm the presence of PAni-HCl and show that films exhibit a reduced roughness and potentially pinhole-free coverage of the substrate. Spectroscopic evidence (UV-vis, FT-IR, and X-ray photoelectron spectroscopy (XPS)) suggests that structural changes and loss of conductivity, not uncommon during PAni processing, does occur during the preparation process. Finally, the applicability of sputtered films to gas-phase sensing of NH_(3) was investigated with surface plasmon resonance (SPR) spectroscopy and compared to previous contributions. In summary, sputtered PAni-HCl films exhibit quantifiable, reversible behavior upon exposure to NH_(3) with a calculated LOD (by method) approaching 0.4 ppm NH_(3) in dry air.
机译:导电聚合物薄膜表现出独特的化学和物理特性,使其成为微电子学,能量存储设备和化学传感器中不可或缺的部分。总的来说,在酸性介质中掺杂的聚苯胺(PAni)具有类似金属的电导率,尽管确切的物理和化学性质取决于聚合物的结构和掺杂剂的类型。由于可加工性差而造成的困难使得掺杂的PAni薄膜的生产特别具有挑战性。在这种贡献中,直流磁控溅射,一种物理气相沉积技术,被用于制备掺杂有盐酸(PAni-HCl)的PAni导电薄膜,以努力避免与常规薄膜制备方法有关的问题。将通过溅射法制造的样品与通过常规滴铸法制备的样品一起进行分析。物理表征(原子力显微镜,AFM)证实了PAni-HCl的存在,并表明薄膜的粗糙度降低,并且可能覆盖基材而无针孔。光谱证据(紫外可见光谱,傅立叶变换红外光谱和X射线光电子能谱(XPS))表明,在制备过程中确实发生了结构变化和电导率损失,这在PAni处理过程中并不罕见。最后,用表面等离子体共振(SPR)光谱研究了溅射薄膜对NH_(3)气相检测的适用性,并与以前的成果进行了比较。总而言之,溅射的PAni-HCl薄膜在暴露于NH_(3)时表现出可量化的可逆行为,在干燥空气中的LOD计算值(通过方法)接近0.4 ppm NH_(3)。

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