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Uncertainty in the Multielemental Quantification by Total-Reflection X-ray Fluorescence: Theoretical and Empirical Approximation

机译:全反射X射线荧光在多元素定量中的不确定性:理论和经验近似

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摘要

Nowadays, the subject of the quality assurance of the analytical results is acquiring more and more importance. This work presents a basic theoretical and empirical approximation to the expanded uncertainty associated to the TXRF measurements. Two theoretical models has been proposed and compared systematically with the empirical expanded uncertainty obtained. The main consequences derived of this work are the following; theoretical model B explains with a high degree of agreement the empirical expanded uncertainties associated to the TXRF measurements, while theoretical model A explains partially the instrumental repeatability of the TXRF system. On the other hand, an unexpected U-behavior has been found for the empirical uncertainty in TXRF measurements whose explanation can be due to the sum of several sources of uncertainty not considered like variations of the Compton background or the nonlinearity of the Si(Li) detector quantum efficiency. Additionally, it has been shown that the roughness and small geometrical variations of the sample depositions are the more important uncertainty sources in the experimental TXRF measurements.
机译:如今,分析结果质量保证的主题越来越重要。这项工作提出了与TXRF测量相关的扩展不确定性的基本理论和经验近似值。提出了两个理论模型,并与获得的经验扩展不确定性进行了系统比较。这项工作的主要后果如下:理论模型B高度一致地解释了与TXRF测量相关的经验扩展不确定性,而理论模型A部分解释了TXRF系统的仪器可重复性。另一方面,对于TXRF测量中的经验不确定性,已经发现了意外的U行为,其解释可能是由于几种不确定性源的总和而未考虑的,例如康普顿背景的变化或Si(Li)的非线性检测器量子效率。另外,已经表明,样品沉积物的粗糙度和小的几何变化是实验TXRF测量中更重要的不确定性来源。

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