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Highly-Ordered 3D Vertical Resistive Switching Memory Arrays with Ultralow Power Consumption and Ultrahigh Density

机译:具有超低功耗和超高密度的高阶3D垂直电阻开关存储阵列

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Resistive switching random access memories (RRAM) have attracted great scientific and industrial attention for next generation data storage because of their advantages of nonvolatile properties, high density, low power consumption, fast writing/erasing speed, good endurance, and simple and small operation system. Here, by using a template-assisted technique, we demonstrate a three-dimensional highly ordered vertical RRAM device array with density as high as that of the nanopores of the template (10(8)-10(9) cm(-2)), which can also be fabricated in large area. The high crystallinity of the materials, the large contact area and the intimate semiconductor/electrode interface (3 nm interfacial layer) make the ultralow voltage operation (millivolt magnitude) and ultralow power consumption (picowatt) possible. Our procedure for fabrication of the nanodevice arrays in large area can be used for producing many other different materials and such three-dimensional electronic device arrays with the capability to adjust the device densities can be extended to other applications of the next generation nanodevice technology.
机译:电阻切换随机存取存储器(RRAM)具有非易失性,高密度,低功耗,快速写入/擦除速度,良好的耐用性以及简单易用的操作系统等优点,已引起下一代数据存储的科学和工业关注。 。在这里,通过使用模板辅助技术,我们演示了三维高度有序的垂直RRAM器件阵列,其密度与模板的纳米孔(10(8)-10(9)cm(-2))的密度一样高。 ,也可以大面积制造。材料的高结晶度,大接触面积和紧密的半导体/电极界面(3 nm界面层)使超低压操作(毫伏级)和超低功耗(皮瓦)成为可能。我们大面积制造纳米器件阵列的过程可以用于生产许多其他不同的材料,并且这种具有调节器件密度的三维电子器件阵列可以扩展到下一代纳米器件技术的其他应用。

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