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Atomic Layer Deposition of p-Type Epitaxial Thin Films of Undoped and N-Doped Anatase TiO2

机译:未掺杂和N掺杂的锐钛矿型TiO2的p型外延薄膜的原子层沉积

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摘要

Employing atomic layer deposition, we have grown p-type epitaxial undoped and N-doped' anatase TiO2(001) thin films on c-axis Al2O3 substrate. From X-ray diffraction and transmission electron microscopy studies, crystallographic relationships-between the film and the substrate are found to be (001)(TiO2)/(0001)(Al2O3) and [(1) over bar 10](TiO2)//[01 (1) over bar0]Al2O3. N-doping in TiO2 thin films enhances the hole concentration and mobility. The optical band gap of anatase TiO2 (3.23 eV) decreases to 3.07 eV upon N-doping. The epitaxial films exhibit room-temperature ferromagnetism and photoresponse. A TiO2-based homojunction diode was fabricated with rectification from the p-n junction formed between N-doped p-TiO2 and n-TiO2.
机译:利用原子层沉积,我们在c轴Al2O3衬底上生长了p型外延未掺杂和N掺杂的锐钛矿型TiO2(001)薄膜。通过X射线衍射和透射电子显微镜研究,发现薄膜与基材之间的晶体学关系为(001)(TiO2)/(0001)(Al2O3)和[(1)超过10条](TiO2)/ / [01(1)over bar0] Al2O3。 TiO2薄膜中的N掺杂可提高空穴浓度和迁移率。 N掺杂后,锐钛矿型TiO2的光学带隙(3.23 eV)减小至3.07 eV。外延膜表现出室温的铁磁性和光响应。通过对N掺杂的p-TiO2和n-TiO2之间形成的p-n结进行整流,制造了基于TiO2的同质结二极管。

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