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Design and Simulation of Asymmetric MOSFETs

机译:非对称MOSFET的设计与仿真

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摘要

An asymmetric MOSFET (with no LDD on the source side) is simulated on bulk-Si using a device simulator (SILVACO). We have introduced not only a mesa structure to reduce the drain influence on the source but also an asymmetric LDD structure which does not have LDD at the source region to increase drive current (ION)- First of all, we have simulated to compare the characteristics between asymmetric and symmetric MOSFETs. Basically, both asymmetric and symmetric MOSFETs have an n-type channel (25 nm) and the same physical parameters. According to the simulation results, the 25 nm asymmetric MOSFET has the drive current (I{sub}(ON)) of 668μA/μm at V{sub}G-V{sub}(TH)=0.8 V and V{sub}(DS)=1 V. It has off current (I{sub}(OFF)) of 0.475 μA/μm at V{sub}G-V{sub}(TH)= -0.2 V and V{sub}(DS)=1 V. The threshold voltage is 0.1 V at V{sub}(DS)=0.05 V and sub-threshold swing [SS] is 100 mV/dec and DIBL is 120 mV/V. When we compare this with the 25 nm symmetric MOSFET, the asymmetric MOSFET shows bfetter device performances.
机译:使用器件仿真器(SILVACO)在体硅上仿真非对称MOSFET(源极侧没有LDD)。我们不仅引入了台面结构来减少漏极对源极的影响,而且还引入了一种不对称的LDD结构,该结构在源极区域没有LDD来增加驱动电流(ION)-首先,我们进行了仿真以比较其特性在非对称和对称MOSFET之间。基本上,非对称和对称MOSFET都具有n型沟道(25 nm)和相同的物理参数。根据仿真结果,在V {sub} GV {sub}(TH)= 0.8 V和V {sub}(DS)时,该25 nm非对称MOSFET的驱动电流(I {sub}(ON))为668μA/μm。 )= 1V。在V {sub} GV {sub}(TH)= -0.2 V且V {sub}(DS)= 1 V时,它的截止电流(I {sub}(OFF))为0.475μA/μm。 V {sub}(DS)= 0.05 V时,阈值电压为0.1 V,亚阈值摆幅[SS]为100 mV / dec,DIBL为120 mV / V。当我们将其与25 nm对称MOSFET进行比较时,非对称MOSFET表现出更好的器件性能。

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