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Relation between contact reliability and electrical conductivity of copper alloys for large current terminal

机译:大电流端子用铜合金的接触可靠性与导电率的关系

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摘要

For copper alloys applied to large current terminals, high electrical conductivity is necessary in order to keep its contact reliability. Furthermore, stress relaxation property is important in order to keep low contact resistance. Stress relaxation, creep and leak resistance properties were compared for two different copper alloys having nearly same high conductivity. One was strengthened by Fe{sub}2P particles and another by α and γ-Fe particles. Though the species of strengthening dispersoids were quite effective on the creep, the species of dispersoids had no influence on the stress relaxation property. For holding low resistance of insulation displacement contact between copper alloy surfaces without tin plating, the creep may be more important than the stress relaxation, because a small amount of creep strain must be enough to permit oxidization in the gastight contacts. Finally, the leak resistance property was compared for these high conductivity copper alloys. Mainly the chemical composition of these alloys seemed to be effective on the leak current.
机译:对于应用于大电流端子的铜合金,为了保持其接触可靠性,必须具有高电导率。此外,应力松弛性能对于保持低接触电阻很重要。比较了具有几乎相同的高电导率的两种不同铜合金的应力松弛,蠕变和抗渗漏性能。一种通过Fe {sub} 2P颗粒增强,另一种通过α和γ-Fe颗粒增强。尽管强化弥散体的种类对蠕变非常有效,但弥散体的种类对应力松弛性能没有影响。为了在不镀锡的情况下保持铜合金表面之间的绝缘位移接触的低电阻,蠕变可能比应力松弛更为重要,因为少量的蠕变应变必须足以允许气密接触中的氧化。最后,比较了这些高电导率铜合金的防漏性能。这些合金的化学成分主要似乎对泄漏电流有效。

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