Spin-Polarized Scanning Tunneling Microscopy for Magnetic Imaging with Nanometer Spatial Resolution

摘要

Toshiba has developed spin-polarized scanning tunneling microscopy for magnetic imaging of magnetic storage materials. Magnetic information was obtained utilizing the bias-voltage dependence of the spin-polarization of the system. The magnetization direction of Co elements was displayed as two-dimensional images with a contrast ratio of 23 percent. This analysis method can be used to reveal the magnetic structures of ultrafine magnetic materials of nanometer size.