首页>
外国专利>
METHOD TO MEASURE 3 COMPONENT OF THE MAGNETIC FIELD VECTOR AT NANOMETER RESOLUTION USING SCANNING HALL PROBE MICROSCOPY
METHOD TO MEASURE 3 COMPONENT OF THE MAGNETIC FIELD VECTOR AT NANOMETER RESOLUTION USING SCANNING HALL PROBE MICROSCOPY
展开▼
机译:扫描霍尔探针显微镜测量纳米分辨率下磁场矢量的3分量的方法
展开▼
页面导航
摘要
著录项
相似文献
摘要
Scanning hall probe microscopy is used to measure 3 components of the magnetic field vector at nanometer resolution by connecting of Hall probe to the end of the piezo scanner, then gluing of the sample to the sample holder, thereafter positioning of the SHPM head under the optical microscope with approximately X40 magnification, then moving back of the slider puck around approximately 30 steps or moving the sensor or sample back by suffient amount using motors, piezo or other positioner such that signal decays to negligible levels; thereafter setting the temperature of cryostat or to desired temperature, then offset nulling of the Hall sensor in gradiometer or normal conditions, and finally setting of the scan area, speed, resolution and the acquisition channels through SPM control program.
展开▼