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首页> 外文期刊>希土類 >Measurement of reaction probability r (H_2, O_2, H_2O) on Nd films surface under ultra high vacuum condition
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Measurement of reaction probability r (H_2, O_2, H_2O) on Nd films surface under ultra high vacuum condition

机译:超高真空条件下Nd膜表面反应概率r(H_2,O_2,H_2O)的测量

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We measured the reaction probability r of hydrogen (H_2), oxygen (O_2), water(H_2O) on Nd film surface under ultra high vacuum condition, when the Nd films reacted with H_2,O_2 and H_2O. The Nd films exhibited the highest reaction probability r=1 for each gas (H_2,O_2,H_2O) at initial stage. With increasing amounts of reacted H_2, the reaction probability of H_2 decreased gradually. However in the case of the O_2 reaction, r decreased rapidly, and the gas amount reacted was very small compared with that of r to H_2. Among these gas reactions, the highest initial reaction probability, r=1 for H_2O was found to proceed longest.
机译:当Nd薄膜与H_2,O_2和H_2O发生反应时,我们在超高真空条件下测量了氢(H_2),氧(O_2),水(H_2O)在Nd薄膜表面的反应概率r。在初始阶段,Nd膜对每种气体(H_2,O_2,H_2O)表现出最高的反应概率r = 1。随着H_2反应量的增加,H_2的反应概率逐渐降低。然而,在O_2反应的情况下,r迅速降低,并且与r至H_2的反应相比,反应的气体量非常小。在这些气体反应中,最高的初始反应概率(H = 1O的r = 1)进行得最长。

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