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The measurement of the reaction probability of O_2 and the temperature dependence of the reaction probability on a Ce film evaporated under ultra high vacuum

机译:O_2反应概率的测量及反应概率对超高真空蒸发的CE膜的温度依赖性

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摘要

The reaction probability of O_2 on Ce films was measured at 273K, 298K and 338K using a volumetric method. With increasing oxide layers the reaction probabilities decrease drastically at each temperature. When gas amounts was larger than 75ML, the O_2 reaction probability became dependent on temperature. The O_2 reactivity was quite different for each temperature.
机译:使用体积法测量273k,298k和338k测量Ce膜上的O_2的反应概率。 随着氧化物层的增加,反应概率在每个温度下急剧下降。 当气体量大于75ml时,O_2反应概率取决于温度。 O_2反应性对于每个温度非常不同。

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