A field-programmable gate array architecture with fault detection and recovery capability

摘要

Due to the exponential growth of the density and capacity of VLSI technology, it becomes increasingly difficult to achieve higher performance while keeping a high level of system reliability. In order to construct highly reliable systems with next-generation VLSI technology, not only the improvements in fabrication technology, but also active measures are required to deal with temporary/permanent hardware faults in integrated components. This paper investigates the potential of Field-Programmable Gate Arrays (FPGAs) to realize reliable Systems with self-repair capability. We propose a new FPGA architecture that can detect hardware faults during operation, and can recover the correct function by reconfiguring its structure.