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首页> 外文期刊>Journal of the Physical Society of Japan >Electronic State of CeFe_4As_(12) Investigated by Using Single Crystals Grown under High Pressure of 4 GPa
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Electronic State of CeFe_4As_(12) Investigated by Using Single Crystals Grown under High Pressure of 4 GPa

机译:通过在4 GPa高压下生长的单晶研究CeFe_4As_(12)的电子态

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摘要

The electronic transport, magnetic, and specific heat measurements on CeFe_4As_(12) single crystals grown under high pressure of ~4 GPa have been performed, in order to clarify the reported contradictory results on the electronic state between the single crystals grown under minute pressure of ~4 MPa and polycrystalline samples synthesized under high pressure (~4 GPa). Special emphasis was put on the huge sample dependent physical properties reported in the former, which was attributed to huge sample dependent lattice constant and morphology of grown single crystals. We found similar sample-dependent electronic transport properties also in our high pressure grown single crystals with little sample dependence of the lattice constant, suggesting that neither the lattice constant nor morphology has direct connection with the electronic properties in CeFe_4A_(12). Based on these facts, the reason for such a sensitive sampledependent electronic transport properties of CeFe_4As_(12) is discussed, in correlation with the marginal Kondosemiconducting ground state of this material.
机译:对在〜4 GPa高压下生长的CeFe_4As_(12)单晶进行了电子输运,磁学和比热测量,以阐明报道的关于在微弱压力下生长的单晶之间电子状态的矛盾结果。 〜4 MPa,并在高压(〜4 GPa)下合成多晶样品。特别强调了前者报道的巨大的样品依赖性物理特性,这归因于巨大的样品依赖性晶格常数和生长的单晶的形态。我们在高压生长的单晶中也发现了相似的样品依赖性电子传输性质,而晶格常数的样品依赖性很小,这表明晶格常数和形态都与CeFe_4A_(12)中的电子性质没有直接关系。基于这些事实,讨论了CeFe_4As_(12)如此依赖样品的电子输运特性的原因,并与该材料的边缘近邻介导基态相关。

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