...
首页> 外文期刊>Journal of the Physical Society of Japan >Soft X-ray Core-Level Photoemission Study of Boron Sites in Heavily Boron-Doped Diamond Films
【24h】

Soft X-ray Core-Level Photoemission Study of Boron Sites in Heavily Boron-Doped Diamond Films

机译:重硼掺杂金刚石薄膜中硼位的软X射线核能级光发射研究

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       

摘要

We have performed high-resolution soft x-ray B is core-level photoemission spectroscopy of heavily boron-doped diamond films in order to study the chemical sites of doped-boron atoms and their relation to the superconducting transition temperature (T_c). We find that B is core-level spectra exhibit several fine structures and three bulk components can be resolved from photon energy dependent studies and spectral fittings. These results indicate existence of several chemical environments of doped-boron atoms. One of the bulk components having the lowest binding energy can be assigned to a signal from substitutionally doped-boron atoms. Comparisons of bulk components with T_c suggest spectroscopic evidence for the importance of substitutionally doped-boron atoms for effective carrier and super_conductivity.
机译:为了研究掺杂硼原子的金刚石薄膜的化学位及其与超导转变温度(T_c)的关系,我们已经执行了重掺杂硼的金刚石薄膜的高分辨率软X射线B核能级光发射光谱学。我们发现,B是核心级光谱,展现出一些精细的结构,并且可以通过光子能量相关研究和光谱拟合来解析三个主体成分。这些结果表明存在掺杂硼原子的几种化学环境。具有最低结合能的本体组分之一可以分配给来自被取代掺杂的硼原子的信号。体成分与T_c的比较表明,光谱证据表明取代掺杂的硼原子对于有效载流子和超导性的重要性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号