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Effect of Charge Redistribution on the Thermal-Expansion Behaviors in III-V Semiconductors

机译:电荷重新分布对III-V半导体中热膨胀行为的影响

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摘要

The thermal-expansion behaviors of zincblende GaP, GaAs, GaSb, BP, BAs, and BSb are comparatively studied by first-principles response-function calculation. In contrast to these gallium phases and the most of other III–V semiconductors, low-temperature negative thermal expansion is not found in the three bondes. In order to explore the reason for the difference, the roles of the pressure-induced redistributions of the static and dynamic charges in the lattice-dynamic process of these phases are analyzed in details. Our study shows that the static charge moves towards the bond center and the dynamic effective charge decreases as a hydrostatic pressure is applied to these gallium phases, which leads to the reductions in their polarity and ionicity. However, both of the static and dynamic charges behave inversely in the three bondes. As a result, these bondes' polarity and ionicity will increase under pressure. The fact suggests a correlation between polarity reduction and negative thermal expansion in III–V semiconductors.
机译:通过第一性原理响应函数计算,比较研究了闪锌矿型GaP,GaAs,GaSb,BP,BAs和BSb的热膨胀行为。与这些镓相和大多数其他III-V半导体相反,在这三个键中未发现低温负热膨胀。为了探究产生这种差异的原因,详细分析了静电荷和动电荷的压力引起的重新分布在这些阶段的晶格动力学过程中的作用。我们的研究表明,当对这些镓相施加静水压力时,静电荷向键中心移动,动态有效电荷减少,这导致极性和离子性降低。但是,静态电荷和动态电荷在这三个键中的行为相反。结果,这些键的极性和离子性将在压力下增加。事实表明,III-V族半导体的极性降低与负热膨胀之间存在相关性。

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