Application of X-ray Fluorescence (XRF) Absolute Analysis Method for Silica Refractories

摘要

X-ray fluorescence (XRF) analysis is broadly utilized in industrial and academic fields as a rapid and precise analysis method for major and/or trace elements. XRF analysis is categorized as a relative method because the analysis is conducted with calibration curves which refer to certified analytical values of standard materials, such as Japanese Refractory Reference Materials (JRRM) series. Upgrading XRF analysis to an absolute method will be quite useful for determining absolute quantitative analytical values in the fields where standard materials are not available to provide a great contribution in many industries. When applying the XRF absolute analysis for multi-component silica refractories, the calibration curve is integrated with combining binary system basic calibration curves which are created with high purity reagents and/or a reference standard solution and coexisting component effect correction with theoretical coefficients. XRF absolute analysis on Al_2O_3 5 mass% samples provides 0.009 mass% of inter-group accuracy (reproducibility) and 0.006 mass % of inner-group accuracy (repeatability), both of which are better than those (0.028 and 0.031 mass%, respectively) analyzed with the ICP-AES method which is recognized as an absolute method in JIS R2212-2. XRF absolute analysis values on JRRM 200 series as well as renewed 201a and 205a are in good conformity to their certified values with no significant bias.