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Heat Transfer During Multiwire Sawing of Silicon Wafers

机译:硅片多线锯切过程中的热传递

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摘要

During sawing of silicon wafers for the photovoltaic industry, the variations in temperature will influence the process performance and surface quality of the wafers. To investigate the significance of this effect, the temperature field and heat transfer have been studied experimentally and computationally. Among others, it is found that the temperature typically can increase from 30℃ at the inlet to 65℃ at the outlet of the sawing channel. It is also shown that viscous dissipation is by far the most significant heating source in the process.
机译:在用于光伏工业的硅晶片的锯切期间,温度的变化将影响晶片的工艺性能和表面质量。为了研究这种影响的重要性,已经通过实验和计算研究了温度场和热传递。特别地,发现温度通常可以从锯切通道的进口处的30℃升高到锯切通道的出口处的65℃。还表明,粘性耗散是该过程中最重要的热源。

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