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Role of light intensification by cracks in optical breakdown on surfaces

机译:裂纹引起的光增强在表面光学击穿中的作用

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The intensity distribution of an initially plane light wave incident on planar and conical surface cracks is calculated numerically by using a wave propagation computer code. The results show that light intensity enhancements caused by interference of internal reflections at the crack and the surface are very sensitive to the light polarization, the beam angle of incidence, and the crack geometry (e.g., crack width and orientation with the surface). The light intensity enhancement factor (LIEF) can locally reach 2 orders of magnitude for conical cracks of ideal shape. The electric field direction relative to the crack surfaces determines the light intensity profile around the crack. For normal-incidence illumination on the output surface, total internal reflection at the crack and the surface can occur and leads to higher LIEFs. For identical geometry and illumination conditions, a crack located on the entrance surface of an optic generates electric field enhancements that are weaker than those on the exit surface. As cracks on polished surfaces are randomly oriented, the probability for large intensity enhancements to occur is high. The model is able to predict quantitatively the magnitude of surface laser-induced damage threshold drop and damage propagation enhancement in dielectric materials that are due to cracks.
机译:通过使用波传播计算机代码以数值计算入射在平面和圆锥形表面裂纹上的初始平面光波的强度分布。结果表明,由内部反射在裂纹和表面处的干扰引起的光强增强对光的偏振,光束的入射角以及裂纹的几何形状(例如,裂纹的宽度和与表面的取向)非常敏感。对于理想形状的圆锥形裂纹,光强度增强因子(LIEF)可以局部达到2个数量级。相对于裂纹表面的电场方向决定了裂纹周围的光强分布。对于输出表面上的法向入射照明,可能会在裂纹和表面上发生全内反射,并导致更高的LIEF。对于相同的几何形状和照明条件,位于光学元件入口表面上的裂纹产生的电场增强作用比出口表面上的电场增强作用弱。由于抛光表面上的裂纹是随机取向的,因此发生大强度增强的可能性很高。该模型能够定量预测由于裂纹导致的表面激光诱导的损伤阈值下降和损伤在电介质中传播的增强程度。

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