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首页> 外文期刊>Journal of the European Ceramic Society >CaCu_Ti_4O_(12) ceramics from co-precipitation method: Dielectric properties of pellets and thick films
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CaCu_Ti_4O_(12) ceramics from co-precipitation method: Dielectric properties of pellets and thick films

机译:共沉淀法制备的CaCu_Ti_4O_(12)陶瓷:粒料和厚膜的介电性能

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摘要

Dielectric properties of CaCu_3Ti_4O_(12) (CCTO)-based ceramics and thick films (e approx 50 mum) prepared from powders synthesized by a soft chemistry method (co-precipitation) are presented and discussed. The characteristics of pellets and thick films are compared. The pellets exhibit high values of the dielectric permittivity (epsilon_r approx 1.4 x 10~5) and relatively small dielectric losses (tan delta approx 0.16) at 1 kHz and room temperature. These properties are independent of the nature of the metallization of the electrodes. In addition, the dielectric permittivity decreases when the diameter of the electrodes of the pellets increases, while the losses remain constant. This result, which is strongly related to the nature of the dielectric material in between the electrodes, constitutes a strong indication that the high dielectric permittivity values observed in this material are not related to an interfacial (electrode material) related mechanism but is an internal barrier layer capacitor (IBLC) type. Very high values of the dielectric permittivity of CCTO thick films are measured (epsilon_r approx 5 x 10~4). The differences in dielectric permittivity between thick films and dense pellets may be attributed to the difference in grain size due to different CuO contents, and to the different reactivity of the materials.
机译:介绍并讨论了CaCu_3Ti_4O_(12)(CCTO)基陶瓷的介电性能,以及由通过软化学方法(共沉淀)合成的粉末制备的厚膜(约50μm)。比较了颗粒和厚膜的特性。在1 kHz和室温下,这些颗粒的介电常数较高(ε_r约为1.4 x 10〜5),介电损耗较小(tanδ约为0.16)。这些性质与电极的金属化性质无关。另外,当粒料的电极的直径增加时,介电常数降低,而损耗保持恒定。该结果与电极之间的介电材料的性质密切相关,强烈表明该材料中观察到的高介电常数值与界面(电极材料)相关的机理无关,而是内部障碍层电容器(IBLC)类型。测量出CCTO厚膜的介电常数非常高的值(ε_r约为5 x 10〜4)。厚膜和致密颗粒之间介电常数的差异可能归因于由于CuO含量不同而导致的晶粒尺寸差异,以及材料的反应性不同。

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