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首页> 外文期刊>Journal of the European Ceramic Society >Effects of carbon addition on the electrical properties of bulk silicon-oxycarbide ceramics
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Effects of carbon addition on the electrical properties of bulk silicon-oxycarbide ceramics

机译:碳添加对块状碳氧化硅陶瓷电性能的影响

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The effects of carbon addition on the electrical properties of silicon-oxycarbide (SiOC) ceramics were investigated. The electrical resistivity of the dense bulk SiOC specimen decreased gradually from 4.9 x 10(-1) Omega cm to 4.5 x 10(-2) Omega cm with increasing carbon content from 0 to 16 wt% at room temperature. Raman spectroscopy investigation revealed the existence of a graphite phase characterized by a carbon-carbon sp(2)-bond with increasing density with increasing C content in the SiOC specimen. The decrease in electrical resistivity with increasing C content can be explained in terms of an increase in the density of conductive sp(2)-bonds promoted by carbon precipitation in an amorphous SiOC matrix. The resistivities of the SiOC specimens exhibited slow increases with decreasing temperature in the 2-300 K range, the slowest one (16 wt% C) being 4.5 x 10(-2) Omega cm (300 K) and 5.2 x 0(-2) Omega cm (2 K). (C) 2016 Elsevier Ltd. All rights reserved.
机译:研究了碳添加对碳氧化硅(SiOC)陶瓷电性能的影响。在室温下,随着碳含量从0到16 wt%的增加,致密的块状SiOC标本的电阻率从4.9 x 10(-1)Ωcm逐渐减小到4.5 x 10(-2)Ωcm。拉曼光谱研究表明存在一个以碳-碳sp(2)-键为特征的石墨相,随着SiOC标本中碳含量的增加,碳-碳sp(2)键的密度增加。随着C含量的增加,电阻率的降低可以用无定形SiOC基质中碳沉淀促进的导电sp(2)键密度的增加来解释。 SiOC样品的电阻率在2-300 K范围内随温度降低而显示缓慢增加,最慢的一个(16 wt%C)为4.5 x 10(-2)Ωcm(300 K)和5.2 x 0(-2 )Ω厘米(2 K)。 (C)2016 Elsevier Ltd.保留所有权利。

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