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An ultra high-speed 8-bit timing interleave folding & interpolating analog-to-digital converter with digital foreground calibration technology

机译:具有数字前景校准技术的超高速8位定时交织折叠和内插模数转换器

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摘要

A 2-Gsample/s 8-b analog-to-digital converter in 0.35 gm BiCMOS process technology is presented. The ADC uses the unique folding and interpolating algorithm and dual-channel timing interleave multiplexing technology to achieve a sampling rate of 2 GSPS. Digital calibration technology is used for the offset and gain corrections of the S/H circuit, the offset correction of preamplifier, and the gain and clock phase corrections between channels. As a result of testing, the ADC achieves 7.32 ENOB at an analog input of 484 MHz and 7.1 ENOB at Nyquist input after the chip is self-corrected.
机译:提出了采用0.35 gm BiCMOS工艺技术的2-Gsample / s 8-b模数转换器。 ADC使用独特的折叠和内插算法以及双通道定时交错多路复用技术来实现2 GSPS的采样率。数字校准技术用于S / H电路的偏移和增益校正,前置放大器的偏移校正以及通道之间的增益和时钟相位校正。测试的结果是,芯片经过自我校正后,ADC在484 MHz的模拟输入上达到7.32 ENOB,在Nyquist输入上达到7.1 ENOB。

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