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首页> 外文期刊>Journal of Superconductivity and Novel Magnetism >High Critical Current Densities in MgB_2 Films Grown on Hastelloy Tape by Hybrid Physical-Chemical Vapor Deposition
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High Critical Current Densities in MgB_2 Films Grown on Hastelloy Tape by Hybrid Physical-Chemical Vapor Deposition

机译:混合物理化学气相沉积法在哈氏合金带上生长的MgB_2薄膜中的高临界电流密度

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摘要

We report on the high critical current densities in MgB_2 films directly grown on Hastelloy tapes without any buffer layer by using the hybrid physical-chemical vapor deposition method. MgB_2 films were formed by reaction of Mg metal vapor with the incoming B_2H_6 gas on the heated substrates. In MgB_2 films grown for 10 min at 500℃ in total working pressure 100 Torr with gas mixing ratio H_2:B_2H_6 = 70:30, we observed the transport critical current density (J_c) was approximately 10~6 A/cm~2 at 4 T and 20 K in magnetic fields applied parallel to the substrate plane. This value is higher than those observed in epitaxial MgB_2 films on sapphire substrates grown by using the same method. Magnetic field dependence of J_c of this sample was well explained by the grain-boundary pinning model. Our result opens up a possibility that the coated conductors made of MgB_2 films have a strong potential for high current applications.
机译:我们报告了通过使用混合物理化学气相沉积方法在没有任何缓冲层的情况下直接在Hastelloy胶带上直接生长的MgB_2薄膜中的高临界电流密度。 MgB_2膜是通过使Mg金属蒸气与进入的B_2H_6气体在加热的基材上反应而形成的。在气体混合比为H_2:B_2H_6 = 70:30,总工作压力为100 Torr,在500℃下生长10分钟的MgB_2薄膜中,我们观察到在4时的传输临界电流密度(J_c)约为10〜6 A / cm〜2磁场中的T和20 K平行于基板平面施加。该值高于在使用相同方法生长的蓝宝石衬底上的外延MgB_2膜中观察到的值。晶界钉扎模型很好地解释了该样品的J_c磁场依赖性。我们的结果开辟了一种可能性,即由MgB_2薄膜制成的涂层导体在大电流应用中具有强大的潜力。

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