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首页> 外文期刊>Journal of solid state electrochemistry >Optimization of the parameters for nickel electrowinning using interference microscopy and digital image analysis
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Optimization of the parameters for nickel electrowinning using interference microscopy and digital image analysis

机译:使用干涉显微镜和数字图像分析优化镍电解沉积的参数

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Ni electrodeposition experiments at a constant current density 220 A/m(2) were performed to determine the optimum concentrations of chloride and an organic additive used for an industrial Ni electrowinning. White light interference microscopy was used to acquire digital images of the morphology of the electrodeposited nickel. The scaling analysis was employed to parameterize the morphological information encoded in the images. The standard deviation of the surface height, delta, the critical scaling length, L-c, and the optical roughness, 4 delta/L-c, were determined as a function of the chloride concentration and the amount of organic additives. These parameters were plotted as a function of the two compositional variables. These three-dimensional plots allowed us to find conditions corresponding to the minimum of 4 delta/L-c, at which the deposited nickel is well leveled.
机译:在恒定电流密度220 A / m(2)下进行Ni电沉积实验,以确定用于工业Ni电沉积的氯化物和有机添加剂的最佳浓度。白光干涉显微镜用于获取电沉积镍形态的数字图像。比例分析用于参数化图像中编码的形态信息。确定表面高度的标准偏差,临界氧化皮长度L-c和光学粗糙度4 delta / L-c的标准偏差是氯化物浓度和有机添加剂含量的函数。将这些参数绘制为两个成分变量的函数。这些三维图使我们能够找到对应于最小值4 delta / L-c的条件,在该条件下沉积的镍被很好地拉平。

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