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Combination of emission spectroscopy and fast imagery to characterize high-voltage SF6 circuit breakers

机译:结合发射光谱学和快速成像技术来表征高压SF6断路器

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To investigate the break phenomenon in high-voltage SF6 circuit breakers, a novel experimental approach combining spectroscopy and imagery for measuring electron density, temperature and are geometry is presented. Images of the are were taken using a narrow band optical filter, and spectra of the entire are and in the same spectral region were recorded simultaneously. We report tests both on this method and on the available literature data and the results obtained on two different circuit breaker models. For the high-current phase (I = 2 kA to 10 kA) we chose to study the well isolated 624-641 nm fluorine lines radiating at elevated temperatures, expected to be Tn the range 15 000-20 000 K. With electronic densities higher than 10(17) cm(-3) the Stark effect, as the predominant line broadening mechanism, yields a direct relation between plasma conditions and the measured spectrum. Corrections for eventual self-absorption were applied with the are geometry deduced from the corresponding Images. The results thus obtained compare favourably with and show less scatter than those of the conventional Boltzmann diagram method. They also agree with numerical simulations. During the extinction phase, copper lines between 510 nm and 522 nm radiating at lower temperatures were selected for similar measurements. The images reveal that either a filament-like am or well isolated hot gas pockets are present during extinction. The measured temperature was still high even a few hundred microseconds before ultimate extinction. This result is fully compatible with computations of the cooling process. The hot gas pockets could be used as a tracer for flow velocity measurements. [References: 15]
机译:为了研究高压SF6断路器的断裂现象,提出了一种结合光谱学和图像测量电子密度,温度和几何形状的新颖实验方法。使用窄带滤光片拍摄的图像,并同时记录整个光谱和在相同光谱区域中的光谱。我们报告了有关此方法和可用文献数据以及在两种不同断路器模型上获得的结果的测试。对于大电流阶段(I = 2 kA至10 kA),我们选择研究在高温下辐射良好的隔离624-641 nm氟线,预计其Tn范围为15 000-20 000K。电子密度较高比10(17)cm(-3)的Stark效应作为主要的谱线加宽机制,在等离子体条件和测得的光谱之间产生直接关系。最终自我吸收的校正采用从相应图像推导出的几何形状。这样获得的结果与常规的玻耳兹曼图方法相比具有良好的可比性并且显示出较小的散布。他们也同意数值模拟。在消光阶段,选择在较低温度下辐射的510 nm和522 nm之间的铜线进行相似的测量。图像显示灭绝过程中存在细丝状的am或隔离良好的热气袋。在最终灭绝之前,即使几百微秒,测量的温度仍然很高。该结果与冷却过程的计算完全兼容。热气袋可以用作流速测量的示踪剂。 [参考:15]

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