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The analytic approach in the modelling of one-dimensional electron concentration distribution in some two-valley semiconductor electron devices

机译:某些两谷半导体电子器件中一维电子浓度分布建模的解析方法

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The conventional approach to the modelling of semiconductor devices operation is based on a numerical solution of transport equations. This paper exposes a complete analytical treatment of transport equations for a two-valley semiconductor. We consider the case when the geometry of the analysed structure permits us to assume that the transport in one of the dimensions of the structure is dominant, and when the electric field is homogeneous and stationary. The obtained solution for the case of generally set initial conditions is reduced to the quadratures. We used the example of a p-i-n diode to demonstrate the superiority of the analytical treatment as compared with the numerical one. The proposed approach offers the possibility to determine exactly and quickly the spatial-temporal distribution of the electron concentration within the structure. Considering the accuracy of the analytical procedure, compared with that of the numerical one, the obtained solution could also be used as a kind of standard for the analysis of particular approximate solutions of the considered type of partial differential equation systems. [References: 17]
机译:半导体器件操作建模的常规方法基于传输方程的数值解。本文介绍了两谷半导体传输方程的完整分析方法。我们考虑以下情况:当分析的结构的几何形状允许我们假设在结构的某一维度中的传输占主导地位,并且电场是均匀且稳定的时。对于通常设置的初始条件,所获得的解被简化为正交。我们以p-i-n二极管为例,证明了与数字二极管相比,分析处理的优越性。所提出的方法提供了准确而快速地确定结构内电子浓度的时空分布的可能性。考虑到分析程序的准确性,与数值方法相比,所获得的解还可以用作分析所考虑类型的偏微分方程组的特定近似解的一种标准。 [参考:17]

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