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EUV Research Activity at SEMATECH

机译:SEMATECH的EUV研究活动

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摘要

EUV lithography is needed by the semiconductor industry for both its resolution and for the process simplification it provides compared to multiple patterning. However it needs many innovations to make it a success and is an expensive technology to develop. Major areas of concern are source power, defect free mask availability, defect freedom during use and resist performance. Long term it will also need improved mask and material technology for higher NA EUV imaging. SEMATECH is working on mask technology, defects and resist technology for EUV imaging and has developed new mask inspection technology, novel approaches to EUV resist, lower defectivity mask blanks and improved cleaning methods. SEMATECH's work enables the semiconductor industry to share the cost of developing EUV technology and accelerates the progress of EUV.
机译:与多重图案化相比,半导体行业需要EUV光刻技术来实现其分辨率和简化工艺。但是,它需要许多创新才能成功,并且是一项昂贵的技术。关注的主要领域是源功率,无缺陷掩模的可用性,使用过程中的缺陷自由度和抗蚀剂性能。从长远来看,它还需要改进的掩模和材料技术以实现更高的NA EUV成像。 SEMATECH正在研究用于EUV成像的掩模技术,缺陷和抗蚀剂技术,并已开发出新的掩模检测技术,EUV抗蚀剂的新颖方法,缺陷率更低的掩模坯料和改进的清洁方法。 SEMATECH的工作使半导体行业能够分担开发EUV技术的成本,并加速EUV的发展。

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