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首页> 外文期刊>Journal of Photopolymer Science and Technology >The Evaluation Technologies of Materials Such as Polymers Used in a Semiconductor BEOL Process
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The Evaluation Technologies of Materials Such as Polymers Used in a Semiconductor BEOL Process

机译:半导体BEOL工艺中使用的聚合物等材料的评估技术

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An introduction of new materials has been the important breakthrough in each technology node. For the rapid development of novel materials, material suppliers have founded Consortium for Advanced Semiconductor Materials and Related Technologies (CASMAT) in 2003. CASMAT provides whole equipment for process of Back-end-Of-Line (BEOL), and applies new materials to 300mm silicon wafers. CASMAT evaluates, and reveals important characteristics of those materials, points out issues, also offers efficient solutions to material suppliers. As a result, they can shorten the research and development period of materials, and expand their business because of bringing new products to the market rapidly. As the examples, Test Element Group (TEG) masks and wafers, a quantitative evaluation method of adhesion strength, and an integrated solution for wiring with a polymer low-k material are presented here.
机译:新材料的引入已成为每个技术节点的重要突破。为了快速开发新型材料,材料供应商于2003年成立了先进半导体材料和相关技术联盟(CASMAT)。CASMAT提供用于后端生产线(BEOL)的整套设备,并将新材料应用于300mm硅晶片。 CASMAT评估并揭示这些材料的重要特性,指出问题,还为材料供应商提供有效的解决方案。结果,由于可以将新产品迅速推向市场,因此可以缩短材料的研发周期并扩大业务。作为示例,这里介绍了测试元件组(TEG)掩模和晶圆,粘合强度的定量评估方法以及与聚合物低k材料进行布线的集成解决方案。

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