INVESTIGATION OF TRAPPED LIGHT IN THIN-FILM SILICON SOLAR CELLS

摘要

In thin-film silicon solar cell devices randomly textured interfaces are used to achieve light scattering sufficient for efficient light trapping. We use near-field scanning optical microscopy (NSOM) for visualizing wave guiding mechanisms experimentally by measuring the evanescent modes. Their impact on the light trapping efficiency and the link to topographic structures will be addressed.