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首页> 外文期刊>Journal of optoelectronics and advanced materials >The determination of the optical band and optical constants of non-crystalline and crystalline ZnO thin films deposited by spray pyrolysis
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The determination of the optical band and optical constants of non-crystalline and crystalline ZnO thin films deposited by spray pyrolysis

机译:喷雾热解沉积非晶态ZnO薄膜和结晶态ZnO薄膜的光学带和光学常数的测定

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摘要

The optical constants and optical band gaps of the non-crystalline and crystalline zinc oxide (ZnO) thin films deposited by the spray pyrolysis method onto glass substrates at the different deposition times have been investigated by optical characterization method. The structure of the films was analyzed by X-ray diffraction and the results obtained showed that the film structure changed from non-crystalline to crystalline with increasing the deposition time. The effect of film thickness on the bandgap and optical constants (refractive index, extinction coefficient and dielectric constants) of these films has been investigated and the film thickness changes the optical constants and Urbach energy values of the films. The direct band gaps E-gi of S1, S2, S3 and S4 thin films were determined 3.295 eV 3.280 eV, 3.297 eV and 3.295 eV, respectively. It can be evaluated that the film thickness does almost not change the optical band gap of the films. The width of the tails of localized states in the optical band gap of the films increases with increasing non crystalline film thickness. The dispersion curves of the refractive index of the non crystalline films obey single-oscillator model, whereas the curves of the crystalline films do not obey this model. The dispersion parameters such as E-o. (single-oscillator energy) and E-d (dispersive energy) of the non crystalline films were determined. These values increase with increasing film thickness.
机译:通过光学表征方法研究了在不同的沉积时间下通过喷雾热解法沉积在玻璃基板上的非晶和结晶氧化锌(ZnO)薄膜的光学常数和光学带隙。通过X射线衍射分析膜的结构,获得的结果表明,随着沉积时间的增加,膜结构从非晶态变为结晶态。研究了膜厚度对这些膜的带隙和光学常数(折射率,消光系数和介电常数)的影响,并且膜厚度改变了膜的光学常数和乌尔巴赫能值。 S1,S2,S3和S4薄膜的直接带隙E-gi分别确定为3.295 eV,3.280 eV,3.297 eV和3.295 eV。可以评价的是,膜厚度几乎不改变膜的光学带隙。膜的光学带隙中的局部状态的尾部的宽度随着非晶膜厚度的增加而增加。非晶膜的折射率的色散曲线服从单振荡模型,而晶膜的曲线不服从该模型。色散参数,例如E-o。测定非晶质膜的(单振子能量)和E-d(分散能)。这些值随着膜厚度的增加而增加。

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