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首页> 外文期刊>Journal of Micromechanics and Microengineering >An RF MEMS switch with a differential gap between electrodes for high isolation and low voltage operation
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An RF MEMS switch with a differential gap between electrodes for high isolation and low voltage operation

机译:RF MEMS开关在电极之间具有差分间隙,可实现高隔离和低压操作

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摘要

A double-actuation RF microelectromechanical system (MEMS) switch with high isolation and low voltage operation for RF and microwave applications is presented. The operation voltage of the suggested double-actuation vertical RF MEMS switch structure was reduced without decreasing the actuation gap. Theoretically, the operation voltage of the suggested structure is about 29% lower than that of a single-actuation vertical RF MEMS switch with the same fabrication method, electrode area and equal contact gap. The proposed RF MEMS switch was fabricated by surface micromachining with seven photo-masks on a quartz wafer. To achieve planarization and the stair-like structure, a polyimide sacrificial layer was spin-coated, cured and etched in two steps and patterned by a dry etching step which defines the double-actuation mechanism. The measured results of the fabricated RF MEMS switch demonstrate that the insertion loss was lower than 0.11 dB for the 20 V ON state, the isolation was higher than 39.1 dB for the OFF state and the return loss was better than 32.1 dB for the 20 V ON state from dc to 6 GHz. The minimum pull-in voltage of the fabricated RF MEMS switch was 10 V.
机译:提出了一种用于射频和微波应用的具有高隔离度和低压操作的双致动射频微机电系统(MEMS)开关。所建议的双驱动垂直RF MEMS开关结构的工作电压在不减小驱动间隙的情况下得以降低。从理论上讲,所建议结构的工作电压比采用相同制造方法,电极面积和相等接触间隙的单驱动垂直RF MEMS开关低29%。所提出的RF MEMS开关是通过在石英晶片上使用七个光掩模进行表面微加工而制成的。为了实现平坦化和阶梯状结构,将聚酰亚胺牺牲层分两个步骤旋涂,固化和蚀刻,并通过限定双重驱动机制的干蚀刻步骤进行图案化。制成的RF MEMS开关的测量结果表明,在20 V接通状态下的插入损耗低于0.11 dB,在OFF状态下的隔离度高于39.1 dB,而20 V的回波损耗优于32.1 dB从直流到6 GHz的ON状态。制成的RF MEMS开关的最小吸合电压为10V。

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