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Ultrahigh photo-responsivity and detectivity in multilayer InSe nanosheets phototransistors with broadband response

机译:具有宽带响应的多层InSe纳米片光电晶体管的超高光响应性和检测性

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摘要

We demonstrate the strategies and principles for the performance improvement of layered semiconductor based photodetectors using multilayer indium selenide (InSe) as the model material. It is discovered that multiple reflection interference at the interfaces in the phototransistor device leads to a thickness-dependent photo-response, which provides a guideline to improve the performance of layered semiconductor based phototransistors. The responsivity and detectivity of InSe nanosheet phototransistor can be adjustable using applied gate voltage. Our InSe nanosheet phototransistor exhibits ultrahigh responsivity and detectivity. An ultrahigh external photo-responsivity of similar to 10(4) A W-1 can be achieved from broad spectra ranging from UV to near infrared wavelength using our InSe nanosheet photodetectors. The detectivity of multilayer InSe devices is similar to 10(12) to 10(13) Jones, which surpasses that of the currently exploited InGaAs photodetectors (10(11) to 10(12) Jones). This research shows that multilayer InSe nanosheets are promising materials for high performance photodetectors.
机译:我们演示了使用多层硒化铟(InSe)作为模型材料来提高基于半导体层的光电探测器性能的策略和原理。已经发现,在光电晶体管器件中的界面处的多次反射干扰导致与厚度有关的光响应,这为改善基于半导体的层状光电晶体管的性能提供了指导。可以使用施加的栅极电压来调节InSe纳米片光电晶体管的响应度和检测率。我们的InSe纳米片光电晶体管具有超高的响应度和检测率。使用我们的InSe纳米片光电探测器,可以在从UV到近红外波长的宽光谱范围内实现类似于10(4)A W-1的超高外部光响应性。多层InSe器件的探测率类似于10(12)至10(13)琼斯,超过了目前开发的InGaAs光电探测器(10(11)至10(12)琼斯)的探测率。这项研究表明,多层InSe纳米片是用于高性能光电探测器的有前途的材料。

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