Diffusion Length Measurement in CdS Thin Film by Steady State Photocarrier Grating Technique

摘要

The nanocrystalline thin films of Cadmium sulphide (CdS) are prepared by physical vapour deposition technique in the presence of argon as inert gas at room temperature. The structural and optical characterization of CdS thin film is also reported. XRD pattern of thin films shows that the deposited thin films are nanocrystalline in nature with the hexagonal phase as preferred orientation. We have presented a successful study of the application of the Steady state photocarrier grating techniques (SSPG) of CdS thin films in the ohmic region at room temperature. The diffusion length (L_(diff)) in coplanar geometry has been determined in small signal mode and the conditions have been fulfilled in the SSPG measurement. L_(diff) values are reproducible and in good agreement with the values reported by other workers who used different measurement methods.