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首页> 外文期刊>Journal of nanoscience and nanotechnology >MeV Gold Ion Induced Sputtered Nanoparticles from Gold Nanostructures: Dependence of Incident Flux and Temperature
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MeV Gold Ion Induced Sputtered Nanoparticles from Gold Nanostructures: Dependence of Incident Flux and Temperature

机译:MeV金离子诱导的金纳米结构溅射纳米粒子:入射通量和温度的依赖性

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The high-energy and heavy-ion induced sputtered particles from nanostructures under various conditions can result in variety of size distributions. 1.5 MeV Au{sup}(2+) ions induced sputtering from isolated gold nanostructures deposited on silicon substrate have been studied as a function of incident ion flux (dose rate) and the sputter particle catcher at low temperature. At higher fluxes, a bimodal distribution of the sputtered particles has been observed. Cross-sectional transmission electron microscopy and Rutherford backscattering spectrometry measurements showed that the sputter particle size distribution depends on morphology at surface and interfaces. The results for the size distribution from a catcher at low temperature showed the less agglomeration of ejected clusters on the catcher grids, resulting in the lower-disperse size distribution.
机译:在各种条件下,高能和重离子诱导的纳米结构溅射粒子会导致各种尺寸分布。研究了1.5 MeV Au {sup}(2+)离子从沉积在硅基板上的孤立金纳米结构诱导的溅射与低温下入射离子通量(剂量率)和溅射粒子捕集器的关系。在较高的通量下,已观察到溅射颗粒的双峰分布。截面透射电子显微镜和卢瑟福背散射光谱测量结果表明,溅射粒度分布取决于表面和界面的形貌。收集器在低温下的尺寸分布结果表明,排出的簇在收集器网格上的聚集较少,从而导致较低的分散尺寸分布。

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