Polarization and angle-of-incidence dependence of the Goos-H?nchen shift in total internal reflection at a planar dielectric-dielectric interface

摘要

The Goos-H?nchen shift (GHS) that accompanies total internal reflection (TIR) of a monochromatic p- or s-polarized light beam at a planar interface between a dense medium of incidence of refractive index n_0 and a rarer medium of refractive index n_1 < n_0 is considered as a function of the index ratio, N = n_0_1, and angle of incidence, φ_0. At a unique incidence angle φ_(0e) = sin~(-1)[2/(N~2 + 1)]~(1/2) the GHS is the same for the p and s polarizations, hence the shift becomes independent of polarization. Other significant characteristics associated with TIR at the special angle φ_(0e) are identified. It is also shown that the GHS is nearly independent of φ_0 in the range 45° ≤ φ_(0e) ≤ 90° if the incident light is s-polarized and the index ratio N> 2.5. No comparable results are obtained for incident p-polarized light.