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Fringe localization in interferometers illuminated by a succession of incoherent line sources

机译:一系列非相干线源照亮的干涉仪中的条纹定位

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摘要

It is well known that interference fringes formed by an interferometer that is illuminated with a point source are non-localized and, when it is done with an extended source, they are localized. Nevertheless, when the interferometer is illuminated with a discrete succession of points or lines, the localization of the fringes presents some characteristics that are different from those obtained with the former, for example the discrete number of localization surfaces. In this work we obtain the conditions to fmd the position of the surfaces of localization of these planes for an arbitrary interferometer. Then we apply this method to a wedge interferometer and compare the experimental and theoretical results. [References: 10]
机译:众所周知,由用点光源照射的干涉仪形成的干涉条纹是非局部的,并且当用扩展光源完成时,它们是局部的。然而,当干涉仪用离散的连续点或线照射时,条纹的定位呈现出一些与前者不同的特征,例如离散数量的定位表面。在这项工作中,我们获得了针对任意干涉仪确定这些平面定位表面位置的条件。然后我们将该方法应用于楔形干涉仪并比较了实验结果和理论结果。 [参考:10]

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