首页> 外文期刊>Journal of the Optical Society of America, A. Optics, image science, and vision >Zero fringe visibility in the classical localization plane of a two-beam interferometer
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Zero fringe visibility in the classical localization plane of a two-beam interferometer

机译:两束干涉仪经典定位平面中的零条纹可见性

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In 1987 we published "Fringe localization depth" [Appl. Opt. 26, 5125 (1987)], where, with first principles, we generalized the van Cittert-Zernike theorem for two-beam amplitude-division interferometers illuminated by extended sources. In this generalization the complex degree of coherence between the interfering beams is equivalent to the Fraunhofer diffraction pattern of an aberrated optical system. In 1989 Hariharan and Steel [Appl. Opt. 28, 29 (1989)] commented on this paper and pointed out that the fringe visibility can be zero in the localization plane determined by the conventional pair-of-rays method. Now, we numerically and experimentally show a situation where the equivalent aberrations are such that this finding is verified and that the localization region splits in two, one ahead of and the other behind the classical localization plane.
机译:1987年,我们出版了《边缘定位深度》一书。选择。 26,5125(1987)],其中,根据第一原理,我们推广了由扩展光源照射的两光束振幅分割干涉仪的van Cittert-Zernike定理。在这种概括中,干涉光束之间的复杂相干度等效于像差光学系统的弗劳恩霍夫衍射图。 1989年Hariharan和Steel [Appl。选择。 [28,29(1989)]对此论文进行了评论,并指出在通过常规射线对方法确定的定位平面中,条纹的可见性可以为零。现在,我们以数值和实验方式显示一种情况,在这种情况下,等效像差可以验证这一发现,并且定位区域分成两部分,一个位于经典定位平面的前面,另一个位于经典定位平面的后面。

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