Atomic force microscopy analysis of buckling phenomena in metallic thin films on substrates

Branger V.; Goudeau P.; Boubeker B.; Badawi KF.; Grilhe J.; Coupeau C.

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Atomic force microscopy analysis of buckling phenomena in metallic thin films on substrates

机译：原子力显微镜分析基材上金属薄膜的屈曲现象

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来源
《Journal of Materials Science Letters》 |2000年第4期|共3页
作者
Branger V.; Goudeau P.; Boubeker B.; Badawi KF.; Grilhe J.; Coupeau C.;
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正文语种 eng
中图分类工程材料学;
关键词
Decohesion; Adhesion;

机译：脱粘;粘着;

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专利

1. Atomic force microscopy analysis of buckling phenomena in metallic thin films on substrates [J] . Branger V., Goudeau P., Boubeker B., Journal of Materials Science Letters . 2000,第4期

机译：原子力显微镜分析基材上金属薄膜的屈曲现象
2. ORDERING PHENOMENA IN THIN BLOCK COPOLYMER FILMS STUDIED USING ATOMIC FORCE MICROSCOPY [J] . Vandijk MA., Vandenborg R. Macromolecules . 1995,第20期

机译：原子力显微镜研究薄嵌段共聚物薄膜的排序现象
3. On the use of atomic force microscopy for structural mapping of metallic-glass thin films [J] . J.F. Zeng, J.P. Chu, Y.C. Chen Intermetallics . 2014,第Null期

机译：关于使用原子力显微镜对金属玻璃薄膜进行结构映射
4. A Technique for Measuring the Film Thickness of Ultrathin Metallic Thin Films, 4-20 nm, Using Atomic Force Microscopy [C] . G. Acosta, D.D. Allred, R.C. Davis Society of Vacuum Coaters Annual Technical Conference; 20050423-28; Denver,CO(US) . 2005

机译：利用原子力显微镜测量4-20 nm超薄金属薄膜的膜厚度的技术
5. Analysis of the gallium nitride-sapphire thick films, processed by iodine vapor phase growth by transmission electron microscopy and atomic force microscopy. [D] . Bhaskara, Praveena Murthy. 2001

机译：用透射电子显微镜和原子力显微镜分析碘汽相生长处理的氮化镓-蓝宝石厚膜。
6. Influence of Oxygen Pressure on the Domain Dynamics and Local Electrical Properties of BiFe0.95Mn0.05O3 Thin Films Studied by Piezoresponse Force Microscopy and Conductive Atomic Force Microscopy [O] . Kunyu Zhao, Huizhu Yu, Jian Zou, 2017

机译：氧响应对BiFe0.95Mn0.05O3薄膜的畴动态和局部电学特性的压电响应力显微镜和导电原子力显微镜研究
7. Orientation study of iron phthalocyanine (FePc) thin films deposited on silicon substrate investigated by atomic force microscopy and micro-Raman spectroscopy [O] . M. Szybowicz, J. Makowiecki 2011

机译：原子力显微镜和显微拉曼光谱研究在硅衬底上沉积的酞菁铁薄膜的取向研究

Atomic force microscopy analysis of buckling phenomena in metallic thin films on substrates

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