首页> 外文期刊>Journal of Low Temperature Physics >Electroplated Indium Bumps as Thermal and Electrical Connections of NTD-Ge Sensors for the Fabrication of Microcalorimeter Arrays
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Electroplated Indium Bumps as Thermal and Electrical Connections of NTD-Ge Sensors for the Fabrication of Microcalorimeter Arrays

机译:电镀铟凸点作为NTD-Ge传感器的热和电连接,用于制造微热量计阵列

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摘要

We are developing a method to build arrays of Ge-based microcalorimeters for soft X-rays detection using micro-photolithographic techniques. A key element of the process is the electrical and thermal connection between the germanium sensors and the interconnection electrical tracks, that lay on a substrate acting as mechanical support and thermal sink. The geometry of the sensors, that have a square base truncated pyramid shape, makes feasible a connection through indium soldering. We describe a technique, based on microlithography and electroplating, adopted to grow indium bumps of a few tens of square microns of area and several microns high on top of the contact pads patterned on the substrate. The sensor array is placed over the bumps and a subsequent baking melts the indium, soldering the sensors to the pads.
机译:我们正在开发一种使用微光刻技术构建用于软X射线检测的基于Ge的量热仪阵列的方法。该过程的关键要素是锗传感器与互连电迹线之间的电气和热连接,该布线位于用作机械支撑和散热片的基板上。传感器的几何形状具有方形底部的截棱锥形状,可以通过铟焊实现连接。我们描述了一种基于微光刻和电镀的技术,该技术用于在基板上构图的接触焊盘顶部生长面积为几十平方微米,高为几微米的铟凸点。传感器阵列放置在凸块上,随后的烘烤使铟熔化,将传感器焊接到焊盘上。

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