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Investigating the influence of fabrication process and crystal orientation on shear strength of silicon microcomponents

机译:研究制造工艺和晶体取向对硅微组件剪切强度的影响

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A summary of the influence of microfabrication processes (wet and dry etching) and crystal orientation on the effective shear strength of microridges is addressed in this paper. Test results indicate that both crystal orientation and geometry plays an important role in determining the strength. The largest shear strengths obtained were for triangular and rectangular ridges fabricated with wet etching and deep RIE respectively. Both of these structures had similar crystal orientations. These strength values were approximately 3.5 times larger than the lowest strengths measured for wet etching structures. Using Chlorine RIE, we were able to demonstrate the influence of crystal orientation on strength, with microridges of {110} sidewall made on a (100) wafer the largest. For wet etching, we found that the strength was concentration dependent. For example, a 45% KOH fabricated structure produced strength values 65% higher than 30% KOH fabricated ones (note crystal orientation the same). This was attributed to a geometric effect, that is the 45% KOH solution had a "V" shaped bottom while the 30% KOH had a flat bottom. EDP and TMAH values had similar strengths to the 30% KOH solution (note similar crystal orientation). Therefore, microcomponent strength is strongly dependent upon fabrication process as well as crystal orientation.
机译:本文概述了微加工工艺(湿法和干法刻蚀)和晶体取向对微脊有效剪切强度的影响。测试结果表明,晶体取向和几何形状在确定强度方面都起着重要作用。所获得的最大剪切强度分别是通过湿法刻蚀和深RIE制备的三角形和矩形脊。这两个结构都具有相似的晶体取向。这些强度值大约是对湿法刻蚀结构测得的最低强度的3.5倍。使用氯RIE,我们能够证明晶体取向对强度的影响,在(100)晶片上制作的{110}侧壁的微脊最大。对于湿蚀刻,我们发现强度与浓度有关。例如,45%KOH制成的结构产生的强度值比30%KOH制成的强度高65%(注意晶体取向相同)。这归因于几何效应,即45%的KOH溶液具有“ V”形底部,而30%的KOH溶液具有平坦的底部。 EDP​​和TMAH值与30%KOH溶液具有相似的强度(注意相似的晶体取向)。因此,微部件强度在很大程度上取决于制造工艺以及晶体取向。

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