Computer simulation of normal grain growth in polycrystalline thin films

摘要

A modified Monte Carlo method is proposedto simulate the two-dimensional normal grain growth inpolycrystalline thin films. With the newly modified method,not only the simulation efficiency is improved but also thesimulated time exponent of grain growth attained n=0.49±0.01, which is very close to the theoretical value for steadygrain growth n=0.5. Simulation of the complete process ofnormal grain growth including the steady state is madepossible by means of the present method. The grain sizedistribution in the simulated thin films was found to varycontinuously and slowly with time, the gamma and theHillert functions may be two of the expression forms duringits transition, and the latter corresponds to quasi steady graingrowth. The so called"self-similarity" of the grain sizedistribution during the normal grain growth in two-dimensions is also discussed according to the simulation results.