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Characterisation of fine-grained oxide ceramics

机译:细粒氧化物陶瓷的表征

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A range of high resolution techniques have been used to characterise the grain boundary segregation behaviour of rare earth ( RE) doped ( La, Gd, Eu and Yb) alumina and spinel. TEM based techniques (HR-TEM, HAADF STEM and EDS) have been used to study the structure and chemistry of grain boundaries. The use of a HAADF detector in STEM provides atomic number contrast and easy identification of heavy ( RE) segregants. This has been used to produce high resolution RE elemental maps, showing the width of the segregated region to be less than the size of the electron probe ( 1 nm) for all boundaries studied. EDS showed that within a 1 nm thick boundary region ( an upper limit) the RE cations would account for 10 ( +/- 2)% and 15 ( +/- 2)% of the cation total in alumina and spinel respectively. Preliminary results from ultra- high resolution STEM ( probe size similar to 0.1 nm) suggest that, in spinel, the segregated region is actually composed of a much thinner continuous monolayer of RE atoms at the grain boundary. This is consistent with HR-TEM, which showed spinel grain boundaries possessed minimal grain boundary structural disorder.AFM has been used to study the effect of RE grain boundary segregation on thermal grooving behaviour. The improvement in resolution that is achieved by operating in Tapping(TM) mode is shown to translate into an improved profile of the groove root. This has been used in conjunction with Electron Backscattered Diffraction (EBSD) to examine the relationship between grain boundary geometry and misorientation. The addition of RE dopants to alumina was found to significantly increase the size of grain boundary grooves. This can be attributed to the out-diffusion of RE segregants, an effect which compromises grain boundary energy calculations for materials with grain boundary segregation. AFM and EBSD are also used to relate anisotropic tribo-chemical polishing-wear with grain orientation. (C) 2004 Kluwer Academic Publishers.
机译:一系列高分辨率技术已被用来表征稀土(稀土)掺杂(La,Gd,Eu和Yb)氧化铝和尖晶石的晶界偏析行为。基于TEM的技术(HR-TEM,HAADF STEM和EDS)已用于研究晶界的结构和化学性质。在STEM中使用HAADF检测器可提供原子序数对比,并易于识别重(RE)分离剂。这已用于生成高分辨率的RE元素图,显示对于所有研究的边界,隔离区的宽度均小于电子探针的大小(1 nm)。 EDS显示,在1 nm厚的边界区域(上限)内,RE阳离子分别占氧化铝和尖晶石中阳离子总量的10(+/- 2)%和15(+/- 2)%。超高分辨率STEM(探针尺寸类似于0.1 nm)的初步结果表明,在尖晶石中,隔离区实际上是由晶界处RE原子的连续单层薄得多。这与HR-TEM相一致,HR-TEM表明尖晶石晶界具有最小的晶界结构紊乱。AFM已被用于研究RE晶界偏析对热切槽行为的影响。通过在Tapping TM模式下操作而实现的分辨率的改善显示为转化为凹槽根部的轮廓。它已与电子背散射衍射(EBSD)结合使用,以检查晶界几何形状与取向错误之间的关系。发现向氧化铝中添加RE掺杂剂显着增加了晶界槽的尺寸。这可以归因于稀土元素分离剂的外扩散,这种效应损害了具有晶界偏析的材料的晶界能量计算。 AFM和EBSD也可用于将各向异性的摩擦化学抛光剂与晶粒取向相关联。 (C)2004 Kluwer学术出版社。

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